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Correlative Light and Electron Microscopy (CLEM)

CLEM overcomes the resolution limitations of light microscopy by enabling electron microscopic analysis of an identified region for high-resolution analysis. This technique involves processing specimens for light microscopy and imaging by fluorescence followed by preparation for and imaging by electron microscopy. As a result, the quenching of fluorophores during electron microscopy processing is no longer a concern.

CLEM can be used in combination with both scanning and transmission electron microscopy techniques.

CLEM SEM

High resolution SEM images of HeLa cells on formvar-coated Ni finder grids shwoing ruffles induced by bacterial infection
HeLa cells were grown on formvar-coated Ni finder grids and infected with mCherry transformed Salmonella bacteria (pseudo colored green). Higher resolution SEM images were then obtained for the regions of interest showing the ruffles induced by the bacterial infection.

CLEM TEM

Microscopic images of HeLa cells infected with Chlamydia trachomatis grown on photo-etched glass coverslips
HeLa cells infected with Chlamydia trachomatis grown on photo-etched glass coverslips and labeled with fluorescent tagged anti-elementary body antibody. The TEM images reveal higher resolution information of the cells imaged by light microscopy.

Last Updated August 16, 2013

Last Reviewed August 16, 2013