CLEM overcomes the resolution limitations of light microscopy by enabling electron microscopic analysis of an identified region for high-resolution analysis. This technique involves processing specimens for light microscopy and imaging by fluorescence followed by preparation for and imaging by electron microscopy. As a result, the quenching of fluorophores during electron microscopy processing is no longer a concern.
CLEM can be used in combination with both scanning and transmission electron microscopy techniques.
Last Updated August 16, 2013
Last Reviewed August 16, 2013