Skip Navigation

Translational Research Tools and Services

Skip Content Marketing
  • Share this:
  • submit to facebook
  • Tweet it
  • submit to reddit
  • submit to StumbleUpon
  • submit to Google +

Scanning Electron Microscopy (SEM)

Scanning electron microscopes (SEM) allow high-resolution visualization of exposed surfaces. The NIAID Rocky Mountain Laboratories Microscopy Unit currently operates two SEMs:

Photo of a Hitachi SU-8000, a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detectors
Hitachi SU-8000. Credit: NIAID
  1. Hitachi SU-8000, a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detectors
  2. Hitachi S-5200, 30 kV field emission electron microscope with ultra high-resolution in-lens sample stage and both secondary and backscatter detectors. The Gatan 626 cryo-stage available allows viewing specimens under cryo-conditions.

Related Techniques and Technologies

Ultrastructural Investigations – SEM

Borrelia hermsii
Scanning electron micrograph of Borrelia hermsii, the causative agent of relapsing fever, interacting with red blood cells. Credit: NIAID
Coxiella burnetti
Scanning electron micrography of a fractured Vero cell exposing the contents of a vacuole where Coxiella burnetti, the bacteria causing Q-fever are busy growing. Credit: NIAID
Mycobacterium tuberculosis
Scanning electron micrograph of Mycobacterium tuberculosis. Credit: NIAID

Last Updated December 11, 2013

Last Reviewed December 11, 2013