Scanning Electron Microscopy (SEM)

Scanning electron microscopes allow high-resolution visualization of exposed surfaces. The NIAID Rocky Mountain Laboratories Microscopy Unit currently operates two SEMs:

  1. Hitachi SU-8000 – a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detectors
  2. Hitachi S-5200 – a 30 kV field emission electron microscope with ultra high-resolution in-lens sample stage and both secondary and backscatter detectors. The Gatan 626 cryo-stage available allows viewing specimens under cryo-conditions.

Hitachi SU-8000.
Hitachi SU-8000.
Credit: NIAID

Related Techniques and Technologies

Electron micrograph of Borrelia hermsii
Scanning electron micrograph of Borrelia hermsii, the causative agent of relapsing fever, interacting with red blood cells.
Credit: NIAID

 Electron micrography of a fractured Vero cell

Scanning electron micrography of a fractured Vero cell exposing the contents of a vacuole where Coxiella burnetti, the bacteria causing Q-fever are busy growing.

Credit: NIAID

Electron micrograph of Mycobacterium tuberculosis

Scanning electron micrograph of Mycobacterium tuberculosis.

Credit: NIAID
Content last reviewed on December 11, 2013