Scanning Electron Microscopy (SEM)

Scanning electron microscopes allow high-resolution visualization of exposed surfaces. The NIAID Rocky Mountain Laboratories Microscopy Unit currently operates two SEMs:

  1. Hitachi SU-8000 – a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detectors
  2. Hitachi S-5200 – a 30 kV field emission electron microscope with ultra high-resolution in-lens sample stage and both secondary and backscatter detectors. The Gatan 626 cryo-stage available allows viewing specimens under cryo-conditions.
Hitachi SU-8000, a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detector.

Hitachi SU-8000, a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detector.

Credit
NIAID

Related Techniques and Technologies

Electron micrograph of Borrelia hermsii

Scanning electron micrograph of Borrelia hermsii, the causative agent of relapsing fever, interacting with red blood cells.

Electron micrography of a fractured Vero cell

Scanning electron micrography of a fractured Vero cell exposing the contents of a vacuole where Coxiella burnetti, the bacteria causing Q-fever are busy growing.

Electron micrograph of Mycobacterium tuberculosis

Scanning electron micrograph of Mycobacterium tuberculosis.

Credit
NIAID
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