Scanning electron microscopes allow high-resolution visualization of exposed surfaces. The NIAID Rocky Mountain Laboratories Microscopy Unit currently operates two SEMs:
- Hitachi SU-8000 – a semi-in-lens 30 kV field emission electron microscope with secondary, backscatter, and STEM detectors
- Hitachi S-5200 – a 30 kV field emission electron microscope with ultra high-resolution in-lens sample stage and both secondary and backscatter detectors. The Gatan 626 cryo-stage available allows viewing specimens under cryo-conditions.